INTERNATIONAL PATENT: CREELED, INC. FILES APPLICATION FOR "DESIGN FOR TEST SCANNING FOR LIGHT-EMITTING DIODE PACKAGES AND RELATED METHODS"

GENEVA, April 30 -- CREELED, INC. (4001 E Hwy 54Suite 2000Durham, North Carolina 27709) filed a patent application (PCT/US2024/051211) for "DESIGN FOR TEST SCANNING FOR LIGHT-EMITTING DIODE PACKAGES AND RELATED METHODS" on Oct 14, 2024. With publication no. WO/2025/085357, the details related to the patent application was published on Apr 24, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HUSSELL, Christopher P. (11200 Ridgegate Dr.Raleigh, North Carolina 27617)

Abstract: Light-emitting devices and, more particularly, design for test (DFT) scanning in light-emitting diode (LED) packages ...