INTERNATIONAL PATENT: COWINDST CO., LTD., 주식회사 코윈디에스티 FILES APPLICATION FOR "METHOD FOR AUTOMATICALLY INSPECTING, CLASSIFYING AND REMOVING WAFER DEFECT"

GENEVA, Dec. 10 -- COWINDST CO., LTD. (31-16, Jinwi2sandan-ro, Jinwi-myeon,Pyeongtaek-si,Gyeonggi-do 17708), 주식회사 코윈디에스티 (경기도평택시진위면 진위2산단로 31-16) filed a patent application (PCT/KR2024/009667) for "METHOD FOR AUTOMATICALLY INSPECTING, CLASSIFYING AND REMOVING WAFER DEFECT" on Jul 08, 2024. With publication no. WO/2025/249631, the details related to the patent application was published on Dec 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO...