INTERNATIONAL PATENT: CONSEJO SUPERIOR DE INVESTIGACIONES CIENTIFICAS (CSIC) FILES APPLICATION FOR "MACHINE LEARNING METHOD FOR PROCESSING FORCEDISTANCE CURVES IN FORCE MICROSCOPY"

GENEVA, July 29 -- CONSEJO SUPERIOR DE INVESTIGACIONES CIENTIFICAS (CSIC) (C/ Serrano, 11728006 Madrid Madrid) filed a patent application (PCT/EP2024/082497) for "MACHINE LEARNING METHOD FOR PROCESSING FORCEDISTANCE CURVES IN FORCE MICROSCOPY" on Nov 15, 2024. With publication no. WO/2025/153208, the details related to the patent application was published on Jul 24, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): GARCIA GARCIA, Ricardo (Instituto de Ciencia de Materiales de MadridCampus CantoblancoSor Juana Ines de la Cruz, 328049 Madrid Madrid), TEJEDOR REYES, Jaime (Instituto de Ciencia de...