INTERNATIONAL PATENT: COHU GMBH FILES APPLICATION FOR "PROBE HEAD AND PROBE CARD FOR TESTING HIGH VOLTAGE SEMICONDUCTOR COMPONENTS AND SYSTEMS INCLUDING AND METHODS OF USING THE SAME"

GENEVA, Sept. 8 -- COHU GMBH (GeigelsteinstraBe 683059 Kolbermoor) filed a patent application (PCT/EP2025/055228) for "PROBE HEAD AND PROBE CARD FOR TESTING HIGH VOLTAGE SEMICONDUCTOR COMPONENTS AND SYSTEMS INCLUDING AND METHODS OF USING THE SAME" on Feb 26, 2025. With publication no. WO/2025/181174, the details related to the patent application was published on Sep 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ENGELBRECHT, Stefan (Georg-Dorrer-StraBe 283052 Bruckmuhl), MEDERER, Christoph (Matthias-Neff-StraBe 1183075 Bad Feilnbach), WESTENHUBER, Mathias (Sonnenfeld 10a83122 Samerberg)...