GENEVA, Dec. 1 -- CHIPMETRICS OY (Yliopistokatu 780130 Joensuu) filed a patent application (PCT/FI2025/050265) for "TEST STRUCTURE AND FABRICATING METHOD THEREOF" on May 21, 2025. With publication no. WO/2025/242966, the details related to the patent application was published on Nov 27, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): GAO, Feng (c/o Chipmetrics OyYliopistokatu 780130 Joensuu), WERNER, Thomas (c/o Chipmetrics OyYliopistokatu 780130 Joensuu), KINNUNEN, Jussi (c/o Chipmetrics OyYliopistokatu 780130 Joensuu), UTRIAINEN, Mikko (c/o Chipmetrics OyYliopistokatu 780130 Joensuu)
Abst...