INTERNATIONAL PATENT: CHENGDU SINO MICROELECTRONICS TECHNOLOGY CO., LTD., 成都华微电子科技股份有限公司 FILES APPLICATION FOR "TIME-INTERLEAVED ADC MISMATCH CORRECTION METHOD AND TIME-INTERLEAVED ADC"

Posted On: 2025-11-09

GENEVA, Nov. 9 -- CHENGDU SINO MICROELECTRONICS TECHNOLOGY CO., LTD. (No. 2201 or No. 2301, Floors 22-23, Building 1, No. 1800, Middle Section of Yizhou Avenue, Chengdu High Tech Zone, China (Sichuan) Pilot Free Trade ZoneChengdu, Sichuan 610000), 成都华微电子科技股份有限公司 (中国四川省成都市中国（四川）自由贸易试验区成都高新区益州大道中段1800号1栋22-23层2201号、2301号) filed a patent application (PCT/CN2025/072688) for "TIME-INTERLE...

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INTERNATIONAL PATENT: CHENGDU SINO MICROELECTRONICS TECHNOLOGY CO., LTD., 成都华微电子科技股份有限公司 FILES APPLICATION FOR "TIME-INTERLEAVED ADC MISMATCH CORRECTION METHOD AND TIME-INTERLEAVED ADC"