INTERNATIONAL PATENT: CHENGDU SINO MICROELECTRONICS TECHNOLOGY CO., LTD., 成都华微电子科技股份有限公司 FILES APPLICATION FOR "TIME-INTERLEAVED ADC ERROR PARAMETER EXTRACTION AND CALIBRATION METHOD"

GENEVA, Nov. 17 -- CHENGDU SINO MICROELECTRONICS TECHNOLOGY CO., LTD., (22nd Floor, Building 1, No. 1800, Middle Section of Yizhou Avenue, Gaoxin DistrictChengdu, Sichuan 610000), 成都华微电子科技股份有限公司 (中国四川省成都市高新区益州大道中段1800号1栋22-23层2201号、2301号) filed a patent application (PCT/CN2025/073178) for "TIME-INTERLEAVED ADC ERROR PARAMETER EXTRACTION AND CALIBRATION METHOD" on Jan 20, 2025. With publication no. WO/2025/232293, the details related to the patent application was published on Nov 13, 202...