INTERNATIONAL PATENT: CHAN, MING-CHE, 詹明哲 FILES APPLICATION FOR "LASER SCANNING MICROSCOPE COMPRISING ELECTRIC HIGH-ORDER MODULATION EXTRACTION MODULE"

GENEVA, March 17 -- CHAN, Ming-Che (Chi-Mei Building, No.301, Sec.2, Gaofa 3rd Rd., Guiren Dist., Tainan CityTaiwan 71150), 詹明哲 (中国台湾台南市归仁区高发三路二段301号奇美楼323) filed a patent application (PCT/CN2024/116951) for "LASER SCANNING MICROSCOPE COMPRISING ELECTRIC HIGH-ORDER MODULATION EXTRACTION MODULE" on Sep 04, 2024. With publication no. WO/2025/051165, the details related to the patent application was published on Mar 13, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Org...