INTERNATIONAL PATENT: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE FILES APPLICATION FOR "METHOD FOR DETERMINING A THICKNESS MAP OF A LAYER TO BE MEASURED"

GENEVA, Dec. 15 -- CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (3 Rue Michel-Ange75016 PARIS) filed a patent application (PCT/EP2025/064713) for "METHOD FOR DETERMINING A THICKNESS MAP OF A LAYER TO BE MEASURED" on May 27, 2025. With publication no. WO/2025/252555, the details related to the patent application was published on Dec 11, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ARNOULT, Alexandre (C/O LAAS-CNRS7 Avenue du Colonel Roche31400 TOULOUSE)

Abstract: The invention relates to a method for determining a thickness map of a layer to be measured, using a camera and a source. The m...