INTERNATIONAL PATENT: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, ECOLE SUPERIEURE DE PHYSIQUE ET DE CHIMIE INDUSTRIELLES DE LA VILLE DE PARIS, UNIVERSITE GUSTAVE EIFFEL FILES APPLICATION FOR "METHOD FOR ACHIEVING HIGH-RESOLUTION PROBING BY MEANS OF SCATTERED WAVES"

GENEVA, Dec. 1 -- CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (3 rue Michel Ange75016 PARIS), ECOLE SUPERIEURE DE PHYSIQUE ET DE CHIMIE INDUSTRIELLES DE LA VILLE DE PARIS (10 rue Vauquelin75005 PARIS), UNIVERSITE GUSTAVE EIFFEL (Campus de Marne-La-Vallee5 Boulevard Descartes77420 CHAMPS-SUR-MARNE) filed a patent application (PCT/EP2025/063256) for "METHOD FOR ACHIEVING HIGH-RESOLUTION PROBING BY MEANS OF SCATTERED WAVES" on May 14, 2025. With publication no. WO/2025/242512, the details related to the patent application was published on Nov 27, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s):...