GENEVA, May 17 -- CARL ZEISS SMT GMBH (Rudolf-Eber-Strasse 273447 Oberkochen) filed a patent application (PCT/EP2023/080855) for "X-RAY INSPECTION SYSTEM FOR INSPECTION OF AN OBJECT" on Nov 06, 2023. With publication no. WO/2025/098589, the details related to the patent application was published on May 15, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): RUOFF, Johannes (Droste-Huelshoff-Weg 3573431 Aalen)
Abstract:
An X-ray inspection system (1) serves for inspection of an object (2). An X-ray source (9) of the system serves for generating X-rays to propagate through a region of interest ...