GENEVA, June 30 -- CARL ZEISS MULTISEM GMBH (Carl-Zeiss-Strasse 2273447 Oberkochen) filed a patent application (PCT/EP2024/025340) for "MULTI-BEAM CHARGED PARTICLE MICROSCOPE FOR INSPECTION WITH REDUCED CHARGING EFFECTS" on Dec 12, 2024. With publication no. WO/2025/131323, the details related to the patent application was published on Jun 26, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): GARBOWSKI, Tomasz (Rudolf-Eber-Strasse 273447 Oberkochen), MIKSCH, Bjoern (Rudolf-Eber-Strasse 273447 Oberkochen), ZEIDLER, Dirk (Rudolf-Eber-Strasse 273447 Oberkochen), ALIMAN, Michel (Rudolf-Eber-Strass...