INTERNATIONAL PATENT: CARL ZEISS MULTISEM GMBH FILES APPLICATION FOR "MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH IMPROVED DETECTION SYSTEM FOR SECONDARY ELECTRON IMAGING OVER A LARGE RANGE OF LANDING ENERGIES OF PRIMARY ELECTRONS"

GENEVA, June 2 -- CARL ZEISS MULTISEM GMBH (Carl-Zeiss-Strasse 2273447 Oberkochen) filed a patent application (PCT/EP2024/025316) for "MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH IMPROVED DETECTION SYSTEM FOR SECONDARY ELECTRON IMAGING OVER A LARGE RANGE OF LANDING ENERGIES OF PRIMARY ELECTRONS" on Nov 06, 2024. With publication no. WO/2025/108569, the details related to the patent application was published on May 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MENKE, Felix (Carl-Zeiss-Strasse 2273447 Oberkochen), BEHNKE, Michael (Carl-Zeiss-Strasse 2273447 Oberkochen), BITTNER, K...