INTERNATIONAL PATENT: CARL ZEISS MICROSCOPY GMBH, CARL ZEISS MICROSCOPY LTD., CARL ZEISS MULTISEM GMBH FILES APPLICATION FOR "ELECTRON DETECTOR FOR AN ELECTRON MICROSCOPE"

GENEVA, Jan. 5 -- CARL ZEISS MICROSCOPY GMBH (Carl-Zeiss-Promenade 1007745 Jena), CARL ZEISS MICROSCOPY LTD. (1030 Cambourne Business ParkCambridge CB23 6DW), CARL ZEISS MULTISEM GMBH (Carl-Zeiss-Strasse 2273447 Oberkochen) filed a patent application (PCT/EP2025/067106) for "ELECTRON DETECTOR FOR AN ELECTRON MICROSCOPE" on Jun 18, 2025. With publication no. WO/2026/002757, the details related to the patent application was published on Jan 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): EMMRICH, Daniel Alexander (Industriestr. 164380 RoBdorf), ARNOLD, Rainer (Carl-Zeiss-Strasse 2273447 Ob...