INTERNATIONAL PATENT: BRUKER NANO, INC. FILES APPLICATION FOR "METHOD AND APPARATUS OF MAGNETIC PROPERTY MEASUREMENT USING AN AFM OPERATING IN A FORCE MAPPING AFM MODE"

GENEVA, Aug. 13 -- BRUKER NANO, INC. (112 Robin Hill RoadSanta Barbara, CA 93117) filed a patent application (PCT/US2025/014197) for "METHOD AND APPARATUS OF MAGNETIC PROPERTY MEASUREMENT USING AN AFM OPERATING IN A FORCE MAPPING AFM MODE" on Jan 31, 2025. With publication no. WO/2025/166293, the details related to the patent application was published on Aug 07, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HU, Shuiqing (175 N. Kellogg Avenue, Apt. ASanta Barbara, CA 93111), DEWOLF, Peter (129 Le Bout De Barbe07700 Saint Remeze), PODDAR, Rakesh (5707 Willow View DriveCamarillo, CA 93012) ...