INTERNATIONAL PATENT: BRUKER NANO, INC. FILES APPLICATION FOR "HEAT DISSIPATING AFM PROBE"

GENEVA, Sept. 22 -- BRUKER NANO, INC. (112 Robin Hill RoadSanta Barbara, CA 93117) filed a patent application (PCT/US2025/020035) for "HEAT DISSIPATING AFM PROBE" on Mar 14, 2025. With publication no. WO/2025/194101, the details related to the patent application was published on Sep 18, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): ZHIZHIMONTOV, Vladimir (30 Winchester Canyon Rd Spc 3Goleta, CA 93117-1971), PODDAR, Rakesh (5707 Willow View DriveCamarillo, CA 93012)

Abstract: A probe assembly for a surface analysis instrument such as an atomic force microscope (AFM), and a corresponding ...