INTERNATIONAL PATENT: BEIJING JINGWEI HIRAIN TECHNOLOGIES CO., INC, 北京经纬恒润科技股份有限公司 FILES APPLICATION FOR "TIME COMPENSATION METHOD AND SYSTEM FOR INTERFERENCE TEST DEVICE"

GENEVA, Nov. 30 -- BEIJING JINGWEI HIRAIN TECHNOLOGIES CO., INC (4/F, Building 1, 14 Jiuxianqiao RoadChaoyang District, Beijing 100015), 北京经纬恒润科技股份有限公司 (中国北京市朝阳区酒仙桥路14号1幢4层) filed a patent application (PCT/CN2024/104964) for "TIME COMPENSATION METHOD AND SYSTEM FOR INTERFERENCE TEST DEVICE" on Jul 11, 2024. With publication no. WO/2025/241280, the details related to the patent application was published on Nov 27, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed ...