INTERNATIONAL PATENT: BEIJING INSTITUTE OF TECHNOLOGY, 北京理工大学 FILES APPLICATION FOR "INTEGRAL IMAGING PARAMETER OPTIMIZATION METHOD BASED ON DEEP LEARNING AND MULTI-OBJECTIVE GENETIC ALGORITHM"

GENEVA, Jan. 4 -- BEIJING INSTITUTE OF TECHNOLOGY (No. 5, Zhongguancun South StreetHaidian District, Beijing 100081), 北京理工大学 (中国北京市海淀区中关村南大街5号) filed a patent application (PCT/CN2025/094244) for "INTEGRAL IMAGING PARAMETER OPTIMIZATION METHOD BASED ON DEEP LEARNING AND MULTI-OBJECTIVE GENETIC ALGORITHM" on May 12, 2025. With publication no. WO/2026/001358, the details related to the patent application was published on Jan 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organiza...