INTERNATIONAL PATENT: AXON CONNECTED, LLC FILES APPLICATION FOR "METHOD AND APPARATUS FOR DUAL COMB INTERFEROMETRY FOR OPTICAL DEVICE CHARACTERIZATION AND SENSING"

GENEVA, July 3 -- AXON CONNECTED, LLC (379 Reas Ford Rd STE 1Earlysville, Virginia 22936) filed a patent application (PCT/US2024/061665) for "METHOD AND APPARATUS FOR DUAL COMB INTERFEROMETRY FOR OPTICAL DEVICE CHARACTERIZATION AND SENSING" on Dec 23, 2024. With publication no. WO/2025/137679, the details related to the patent application was published on Jun 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BOS, Joseph J. (6059 S 6th StreetKalamazoo, Michigan 49009)

Abstract: An apparatus determines one or more characteristics of an optical device under test (DUT) includes a laser sour...