INTERNATIONAL PATENT: ATT ADVANCED TEMPERATURE TEST SYSTEMS GMBH FILES APPLICATION FOR "CHUCK SYSTEM, METHOD AND USE FOR HOLDING A SEMICONDUCTOR WAFER ON A CHUCK"

GENEVA, Jan. 12 -- ATT ADVANCED TEMPERATURE TEST SYSTEMS GMBH (Fraunhoferstrasse 1182152 Planegg) filed a patent application (PCT/EP2025/068563) for "CHUCK SYSTEM, METHOD AND USE FOR HOLDING A SEMICONDUCTOR WAFER ON A CHUCK" on Jul 01, 2025. With publication no. WO/2026/008571, the details related to the patent application was published on Jan 08, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): EIBL, Markus (ReichenbachstraBe 22A80469 Munchen), GUTEKUNST, Markus (In der Au 1A82346 Machtlfing)

Abstract: A chuck system (1) is designed to hold a semiconductor wafer (100) on a chuck (20) and ha...