INTERNATIONAL PATENT: ASML NETHERLANDS B.V. FILES APPLICATION FOR "WAFER-LEVEL SELECTION FOR ENHANCED INLINE INSPECTION IN SEMICONDUCTOR MANUFACTURING"

GENEVA, Dec. 1 -- ASML NETHERLANDS B.V. (P.O. Box 3245500 AH Veldhoven) filed a patent application (PCT/EP2025/061519) for "WAFER-LEVEL SELECTION FOR ENHANCED INLINE INSPECTION IN SEMICONDUCTOR MANUFACTURING" on Apr 28, 2025. With publication no. WO/2025/242396, the details related to the patent application was published on Nov 27, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): WANG, Zhihuan (80 W Tasman DriveSan Jose, California 95134), LIN, Chenxi (80 W Tasman DriveSan Jose, California 95134), WANG, Fuming (80 W Tasman DriveSan Jose, California 95134), WANG, Te Sheng (80 W Tasman DriveSan...