INTERNATIONAL PATENT: ASML NETHERLANDS B.V. FILES APPLICATION FOR "SYSTEMS AND METHODS FOR SIGNAL-BASED DEFECT CLASSIFICATION IN TRANSIENT INSPECTION"

GENEVA, June 30 -- ASML NETHERLANDS B.V. (P.O. Box 3245500 AH Veldhoven) filed a patent application (PCT/EP2024/083503) for "SYSTEMS AND METHODS FOR SIGNAL-BASED DEFECT CLASSIFICATION IN TRANSIENT INSPECTION" on Nov 25, 2024. With publication no. WO/2025/131570, the details related to the patent application was published on Jun 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): JEN, Chih-Yu (80 W Tasman DriveSan Jose, California 95134), HSU, Shih-Hsin (P.O. Box 3245500 AH Veldhoven), WANG, Hong (P.O. Box 3245500 AH Veldhoven), LIU, Chieh-Hung (P.O. Box 3245500 AH Veldhoven)

Abstract: Sys...