INTERNATIONAL PATENT: ASML NETHERLANDS B.V. FILES APPLICATION FOR "METROLOGY METHOD FOR A DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED COMPUTER PROGRAM"

GENEVA, June 30 -- ASML NETHERLANDS B.V. (P.O. Box 3245500 AH Veldhoven) filed a patent application (PCT/EP2024/083057) for "METROLOGY METHOD FOR A DIGITAL HOLOGRAPHIC MICROSCOPE AND ASSOCIATED COMPUTER PROGRAM" on Nov 21, 2024. With publication no. WO/2025/131523, the details related to the patent application was published on Jun 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): FEIL, Marvin, Gerold (P.O. Box 3245500 AH Veldhoven), VAN SCHAIJK, Theodorus, Thomas, Marinus (P.O. Box 3245500 AH Veldhoven), BUIJS, Robin, Daniel (P.O. Box 3245500 AH Veldhoven)

Abstract: A method of monitori...