INTERNATIONAL PATENT: ARKRAY, INC., アークレイ株式会社 FILES APPLICATION FOR "TESTING METHOD, TESTING DEVICE, TESTING SYSTEM, TESTING PROGRAM, RECORDING MEDIUM AND METHOD FOR GENERATING PROCESSING TIME-TRAINED MODEL"

GENEVA, May 5 -- ARKRAY, INC. (57, Nishiaketa-cho, Higashikujo, Minami-ku, Kyoto-shi, Kyoto6018045), アークレイ株式会社 (京都府京都市南区東九条西明田町５７番地) filed a patent application (PCT/JP2024/035864) for "TESTING METHOD, TESTING DEVICE, TESTING SYSTEM, TESTING PROGRAM, RECORDING MEDIUM, AND METHOD FOR GENERATING PROCESSING TIME-TRAINED MODEL" on Oct 07, 2024. With publication no. WO/2025/089033, the details related to the patent application was published on May 01, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC)...