INTERNATIONAL PATENT: APPLIED MATERIALS ISRAEL LTD. FILES APPLICATION FOR "MEASURING CONTAMINATION ACCUMULATED ON A SEMICONDUCTOR SPECIMEN"

GENEVA, April 28 -- APPLIED MATERIALS ISRAEL LTD. (9 Oppenheimer StreetPark Rabin7670109 Rehovot) filed a patent application (PCT/IL2024/051011) for "MEASURING CONTAMINATION ACCUMULATED ON A SEMICONDUCTOR SPECIMEN" on Oct 15, 2024. With publication no. WO/2025/083688, the details related to the patent application was published on Apr 24, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): GOLDENSHTEIN, Alex (9 Oppenheimer Street,Park Rabin7670109 Rehovot), RUACH NIR, Irit (9 Oppenheimer Street,Park Rabin7670109 Rehovot)

Abstract: A system for monitoring an extent of contamination affecting a ...