INTERNATIONAL PATENT: APPLIED MATERIALS ISRAEL LTD., EUV TECH, INC. FILES APPLICATION FOR "METROLOGY USING JOINT ANGLE AND WAVELENGTH SCATTERING"

GENEVA, May 19 -- APPLIED MATERIALS ISRAEL LTD. (9 Oppenheimer Street, Park Rabin7670109 Rehovot), EUV TECH, INC. (2830 Howe Road, Suite AMartinez, California 94553) filed a patent application (PCT/US2024/054276) for "METROLOGY USING JOINT ANGLE AND WAVELENGTH SCATTERING" on Nov 01, 2024. With publication no. WO/2025/101441, the details related to the patent application was published on May 15, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): GOLANI, Ori (9 Oppenheimer Street, Park Rabin7670109 Rehovot), ALMOG, Ido (9 Oppenheimer Street, Park Rabin7670109 Rehovot), DUDENAS, Peter J. (2830 How...