INTERNATIONAL PATENT: APPLIED MATERIALS,INC, PAPAKIS, IOANNIS FILES APPLICATION FOR "ITERATIVE METROLOGY OF PRODUCT FEATURES"

GENEVA, May 27 -- APPLIED MATERIALS,INC (3050 Bowers AvenueSanta Clara, California 95054), PAPAKIS, Ioannis (1700 North First Street, Apartment 353San Jose, California 95112) filed a patent application (PCT/GR2023/000062) for "ITERATIVE METROLOGY OF PRODUCT FEATURES" on Nov 17, 2023. With publication no. WO/2025/104456, the details related to the patent application was published on May 22, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KUMAR, Abhinav (270 Wild Rose WayMilpitas, California 95035)

Abstract: Disclosed systems and techniques are directed to fast and accurate measurements of ...