INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "WIRELESS MEASUREMENT CHARACTERIZATION"

GENEVA, Aug. 19 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, CA 95054) filed a patent application (PCT/US2025/011683) for "WIRELESS MEASUREMENT CHARACTERIZATION" on Jan 15, 2025. With publication no. WO/2025/170725, the details related to the patent application was published on Aug 14, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HELLMICH, Anke (Siemensstr. 10063755 Alzenau), BAYATI, Amir (4975 Bridgeview LaneSan Jose, CA 95138), MALMS, Christopher (Siemensstrasse 10063755 Alzenau), HARDISON, Lindsay (3050 Bowers AvenueSanta Clara, CA 95054)

Abstract: Embodiments disclose...