INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "SUBSTRATE MEASUREMENT SYSTEMS HAVING SUBSTRATE HOLDERS"

GENEVA, Nov. 11 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/026875) for "SUBSTRATE MEASUREMENT SYSTEMS HAVING SUBSTRATE HOLDERS" on Apr 29, 2025. With publication no. WO/2025/231021, the details related to the patent application was published on Nov 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HU, Chenfei (3050 Bowers AvenueSanta Clara, California 95054), LIU, Chao (3050 Bowers AvenueSanta Clara, California 95054), LIAO, Chien-Min (3050 Bowers AvenueSanta Clara, California 95054), SHULL, Marc David (3050 Bowers Av...