INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "SUBSTRATE DEFECT ANALYSIS BASED ON MULTIPLE DATA TYPES"

GENEVA, Feb. 4 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/038975) for "SUBSTRATE DEFECT ANALYSIS BASED ON MULTIPLE DATA TYPES" on Jul 23, 2025. With publication no. WO/2026/024916, the details related to the patent application was published on Jan 29, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): KUMAR, Bhaskar (3050 Bowers AvenueSanta Clara, California 95054), CHEN, Qinyi (3050 Bowers AvenueSanta Clara, California 95054), PADHI, Deenesh (3050 Bowers AvenueSanta Clara, California 95054), WANG, Hexuan (3050 Bowers Aven...