INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "REAL-TIME MEASUREMENT OF MICROWAVE RESONATORS AS PLASMA DIAGNOSTICS FOR PROCESS MONITORING"

GENEVA, July 10 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, CA 95054) filed a patent application (PCT/US2024/059553) for "REAL-TIME MEASUREMENT OF MICROWAVE RESONATORS AS PLASMA DIAGNOSTICS FOR PROCESS MONITORING" on Dec 11, 2024. With publication no. WO/2025/144593, the details related to the patent application was published on Jul 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): PETERSON, David (1277 Singletary AvenueSan Jose, CA 95126), COUMOU, David (852 Arlberg CircleWebster, NY 14580)

Abstract: Embodiments disclosed herein include an apparatus that comprises a boar...