INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "PARTICLE DEFECT PREDICTION AND CORRECTION BASED ON PROCESS CHAMBER MODELING"

GENEVA, Jan. 20 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/036618) for "PARTICLE DEFECT PREDICTION AND CORRECTION BASED ON PROCESS CHAMBER MODELING" on Jul 07, 2025. With publication no. WO/2026/015436, the details related to the patent application was published on Jan 15, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): VEERAPPAN, Devi Raghavee (3050 Bowers AvenueSanta Clara, California 95054), CAO, Chezheng (3050 Bowers AvenueSanta Clara, California 95054)

Abstract: A method includes providing initial process conditio...