INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "METHOD OF IN SITU LEAK MONITORING IN FLUID CIRCUITS"

GENEVA, Nov. 25 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/024871) for "METHOD OF IN SITU LEAK MONITORING IN FLUID CIRCUITS" on Apr 16, 2025. With publication no. WO/2025/240054, the details related to the patent application was published on Nov 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): HOANG, Hung X. (c/o Applied Materials, Inc., Law Dept., M/S 12693050 Bowers AvenueSanta Clara, California 95054), MARTINEZ, Ricardo (c/o Applied Materials, Inc., Law Dept., M/S 12693050 Bowers AvenueSanta Clara, California 9505...