INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "METHOD AND APPARATUS FOR DETECTING DEFECTS IN A PACKAGE"

GENEVA, March 10 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2024/041651) for "METHOD AND APPARATUS FOR DETECTING DEFECTS IN A PACKAGE" on Aug 09, 2024. With publication no. WO/2025/049075, the details related to the patent application was published on Mar 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): VOLETI, Venkatakaushik (c/o Applied Materials, Inc., Law Dept., M/S 12693050 Bowers AvenueSanta Clara, California 95054), CHANG, Yun-Ching (c/o Applied Materials, Inc., Law Dept., M/S 12693050 Bowers AvenueSanta Clara, Cal...