INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "MEASUREMENT OF INHERENT SUBSTRATE DISTORTION"

GENEVA, Jan. 28 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2024/038403) for "MEASUREMENT OF INHERENT SUBSTRATE DISTORTION" on Jul 17, 2024. With publication no. WO/2025/019601, the details related to the patent application was published on Jan 23, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): PANDEY, Piyush Kumar (3050 Bowers AvenueSanta Clara, California 95054), SEN, Prabal (3050 Bowers AvenueSanta Clara, California 95054), SARAVANAVEL, Ganapathy (3050 Bowers AvenueSanta Clara, California 95054), HANSDA, Himadri Shekhar (...