INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "INTERFEROMETRY-BASED TEMPERATURE MONITORING IN MANUFACTURING SYSTEMS"

GENEVA, June 18 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2024/058295) for "INTERFEROMETRY-BASED TEMPERATURE MONITORING IN MANUFACTURING SYSTEMS" on Dec 03, 2024. With publication no. WO/2025/122518, the details related to the patent application was published on Jun 12, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): NG, Eric Chin Hong (3050 Bowers AvenueSanta Clara, California 95054), VAEZ-IRAVANI, Mehdi (3050 Bowers AvenueSanta Clara, California 95054)

Abstract: Disclosed systems and techniques are directed to interfer...