INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "IN SITU WAFER SEAL CHUCK DEFECTS IDENTIFICATION"

GENEVA, Nov. 5 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/026143) for "IN SITU WAFER SEAL CHUCK DEFECTS IDENTIFICATION" on Apr 24, 2025. With publication no. WO/2025/226917, the details related to the patent application was published on Oct 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SHEELAVANT, Gangadhar (3050 Bowers AvenueSanta Clara, California 95054), VASU, Karthick (3050 Bowers AvenueSanta Clara, California 95054), HIREGOUDRA, Prabhugouda Shekharagouda (3050 Bowers AvenueSanta Clara, California 95054), HARR...