INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "IN-SITU MICROWAVE PLASMA IMPEDANCE MEASUREMENT SYSTEM"

GENEVA, Sept. 10 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, CA 95054) filed a patent application (PCT/US2025/016618) for "IN-SITU MICROWAVE PLASMA IMPEDANCE MEASUREMENT SYSTEM" on Feb 20, 2025. With publication no. WO/2025/183977, the details related to the patent application was published on Sep 04, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): YANG, Xiaokang (3050 Bowers AvenueSanta Clara, CA 95054), FORSTER, John (974 E. Arques AvenueSunnyvale, CA 94085), SESHADRI, Vishesh (3475 Granada Avenue, Apt. 330Santa Clara, CA 95051), KNYAZIK, Andrey (3050 Bowers AvenueSanta Clar...