INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "IMAGE CLASSIFICATION AND OUTLIER DETECTION USING MULTI-LAYER LOSSES"

GENEVA, Nov. 25 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/029211) for "IMAGE CLASSIFICATION AND OUTLIER DETECTION USING MULTI-LAYER LOSSES" on May 13, 2025. With publication no. WO/2025/240528, the details related to the patent application was published on Nov 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DARVESHI, Shantanu Sudhir (3050 Bowers AvenueSanta Clara, California 95054), BERGH, Adrienne Melissa Martin (3050 Bowers AvenueSanta Clara, California 95054), KUMAR, Abhinav (3050 Bowers AvenueSanta Clara, Calif...