INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "GENERATION OF STARTING THICKNESS PROFILE USING IN-SITU MONITORING SYSTEM"

GENEVA, Aug. 26 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/011409) for "GENERATION OF STARTING THICKNESS PROFILE USING IN-SITU MONITORING SYSTEM" on Jan 13, 2025. With publication no. WO/2025/174502, the details related to the patent application was published on Aug 21, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): XU, Kun (3050 Bowers AvenueSanta Clara, California 95054), CHERIAN, Benjamin (3050 Bowers AvenueSanta Clara, California 95054), LEE, Harry Q. (3050 Bowers AvenueSanta Clara, California 95054), WU, Yongneng ...