INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "ENDPOINT DETECTION BY GENERATING SYNTHETIC SENSOR DATA"

GENEVA, July 3 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2024/061576) for "ENDPOINT DETECTION BY GENERATING SYNTHETIC SENSOR DATA" on Dec 20, 2024. With publication no. WO/2025/137643, the details related to the patent application was published on Jun 26, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): LIAN, Lei (3050 Bowers AvenueSanta Clara, California 95054), WALKER, Quentin Ernie (3050 Bowers AvenueSanta Clara, California 95054), MALKOV, Serghei (3050 Bowers AvenueSanta Clara, California 95054), HANSEN, Richard (3050 Bo...