INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "DEFECT DETECTION IN PACKAGING APPLICATION"

GENEVA, March 10 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2024/044129) for "DEFECT DETECTION IN PACKAGING APPLICATION" on Aug 28, 2024. With publication no. WO/2025/049536, the details related to the patent application was published on Mar 06, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): VOLETI, Venkatakaushik (c/o Applied Materials, Inc., Law Dept., M/S 12693050 Bowers AvenueSanta Clara, California 95054), VAEZ-IRAVANI, Mehdi (c/o Applied Materials, Inc., Law Dept., M/S 12693050 Bowers AvenueSanta Clara, California 950...