INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "COMPACT BEAM PROCESSING SYSTEM HAVING IN-SITU IMAGING METROLOGY"

GENEVA, Dec. 16 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, CA 95054) filed a patent application (PCT/US2025/030151) for "COMPACT BEAM PROCESSING SYSTEM HAVING IN-SITU IMAGING METROLOGY" on May 20, 2025. With publication no. WO/2025/254820, the details related to the patent application was published on Dec 11, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): PRAGER, Ryan (35 Dory RoadGloucester, MA 01930), PEREL, Alexander, S. (35 Dory RoadGloucester, MA 01930)

Abstract: A processing system. The processing system may include a plasma chamber to generate a plasma; an extraction...