INTERNATIONAL PATENT: APPLIED MATERIALS, INC. FILES APPLICATION FOR "BRUSH BOX WAFER NOTCH DETECTION METHODS AND EXTENDED FUNCTIONALITY"

GENEVA, Jan. 6 -- APPLIED MATERIALS, INC. (3050 Bowers AvenueSanta Clara, California 95054) filed a patent application (PCT/US2025/032971) for "BRUSH BOX WAFER NOTCH DETECTION METHODS AND EXTENDED FUNCTIONALITY" on Jun 10, 2025. With publication no. WO/2026/005980, the details related to the patent application was published on Jan 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): WONG, Justin H. (c/o Applied Materials, Inc., Law Dept., M/S 12693050 Bowers AvenueSanta Clara, California 95054), CHEN, Tom C. (c/o Applied Materials, Inc., Law Dept., M/S 12693050 Bowers AvenueSanta Clara, Calif...