INTERNATIONAL PATENT: APPLE INC. FILES APPLICATION FOR "UE MEASUREMENT IN COLLIDED RAN AND CN PTW"

GENEVA, Feb. 2 -- APPLE INC. (One Apple Park Way CupertinoCalifornia 95014) filed a patent application (PCT/CN2023/108621) for "UE MEASUREMENT IN COLLIDED RAN AND CN PTW" on Jul 21, 2023. With publication no. WO/2025/019979, the details related to the patent application was published on Jan 30, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CUI, Jie (700 N. Mary Avenue, Mail Stop 71-3HWT, SunnyvaleCalifornia 94085), ZHANG, Dawei (700 N. Mary Avenue, Mail Stop 71-3HWT, SunnyvaleCalifornia 94085), HE, Hong (700 N. Mary Avenue, Mail Stop 71-3HWT, SunnyvaleCalifornia 94085), LI, Qiming (Interna...