INTERNATIONAL PATENT: APPLE INC. FILES APPLICATION FOR "BEAM MEASUREMENT ACCURACY TEST METRIC FOR ARTIFICIAL INTELLIGENCE / MACHINE LANGUAGE (AI/ML) BASED BEAM MANAGEMENT"

GENEVA, Oct. 15 -- APPLE INC. (One Apple Park WayCupertino, CA 95014) filed a patent application (PCT/US2025/022206) for "BEAM MEASUREMENT ACCURACY TEST METRIC FOR ARTIFICIAL INTELLIGENCE / MACHINE LANGUAGE (AI/ML) BASED BEAM MANAGEMENT" on Mar 29, 2025. With publication no. WO/2025/212462, the details related to the patent application was published on Oct 09, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SARRIGEORGIDIS, Konstantinos (One Apple Park WayCupertino, CA 95014), CUI, Jie (One Apple Park WayCupertino, CA 95014), CHEN, Xiang (One Apple Park WayCupertino, CA 95014), TANG, Yang (On...