INTERNATIONAL PATENT: ANTON PAAR QUANTATEC INC. FILES APPLICATION FOR "MEASURING DEVICE AND METHOD FOR ANALYZING A SAMPLE"

GENEVA, May 27 -- ANTON PAAR QUANTATEC INC. (1900 Corporate DriveBoynton Beach, Florida 33426) filed a patent application (PCT/IB2024/061411) for "MEASURING DEVICE AND METHOD FOR ANALYZING A SAMPLE" on Nov 15, 2024. With publication no. WO/2025/104692, the details related to the patent application was published on May 22, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): WU, Pei-ming (8657 Tourmaline BoulevardBoynton Beach, Florida 33472)

Abstract: A measuring device (100) for analyzing a sample (110), which comprises: i) a container (120) configured to accommodate the sample (110) in a con...