INTERNATIONAL PATENT: ANHUI JIYUAN SOFTWARE CO., LTD., 安徽继远软件有限公司 FILES APPLICATION FOR "SOLAR PANEL DEFECT DETECTION METHOD AND SYSTEM BASED ON QUANTUM MEASUREMENT"

GENEVA, Nov. 23 -- ANHUI JIYUAN SOFTWARE CO., LTD. (No. 1800, Xiyou Road, Hefei National Hi-tech Industrial Development DistrictHefei, Anhui 230088), 安徽继远软件有限公司 (中国安徽省合肥市高新区习友路1800号) filed a patent application (PCT/CN2024/135074) for "SOLAR PANEL DEFECT DETECTION METHOD AND SYSTEM BASED ON QUANTUM MEASUREMENT" on Nov 27, 2024. With publication no. WO/2025/236604, the details related to the patent application was published on Nov 20, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the W...