GENEVA, Oct. 18 -- ANALYTIK JENA GMBH+CO. KG (Konrad-Zuse-Str. 107745 Jena) filed a patent application (PCT/EP2025/059137) for "METHOD FOR CALCULATING A SUM PARAMETER OF A SAMPLE" on Apr 03, 2025. With publication no. WO/2025/214875, the details related to the patent application was published on Oct 16, 2025.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): LEHMANN, Roland (Frommannstrasse 77743 Jena)
Abstract: The invention relates to a method for determining a sum parameter of a sample (12) which comprises at least one alkyl compound having at least one CF3 group, by means of a mass spectrometer...