INTERNATIONAL PATENT: AMS-OSRAM INTERNATIONAL GMBH FILES APPLICATION FOR "TEST ARRANGEMENT AND TEST METHOD FOR MEASURING A SEMICONDUCTOR WAFER"

GENEVA, April 6 -- AMS-OSRAM INTERNATIONAL GMBH (Leibnizstr. 493055 Regensburg) filed a patent application (PCT/EP2024/075511) for "TEST ARRANGEMENT AND TEST METHOD FOR MEASURING A SEMICONDUCTOR WAFER" on Sep 12, 2024. With publication no. WO/2025/067889, the details related to the patent application was published on Apr 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SZENKLARZ, Krzysztof (Ulmenweg 194356 Kirchroth), BRAEUER, Armin (c/o ams-OSRAM International GmbHLeibnizstr. 493055 Regensburg)

Abstract: A test arrangement (100) for measuring a semiconductor wafer (40) is specified, w...